Product Description The near infrared CONTOUR IR Digital camera is designed for observation, registration and recording radiation in near infrared zone in 400-1700 nm spectral region emitted by infrared sources such as GaAs IR LED, diode or solid-state lasers as well as for use in infrared microscopy, infrared luminescence, examination of documents, forensics, art restoration and etc. The camera is based on the newest technology CMOS sensor with increased sensitivity, micro lenses on photo cells and intensifying cascades in each element. Camera is connected to PC via USB 2.0 (USB 3.0) cable. Typical applications Laser alignment and safety (IR) Infrared viewer is ideal for alignment of infrared laser beam and optical components in near infrared systems. Semiconductors inspection With a microscope adapter IR viewer can be used to view through the surface of silicon and gallium arsenide wafers. Forensics and art restoration Photo processing Thermal imaging Technical information: Spectral sensitivity CONT-DIG Spectral sensitivity 400-1700nm Sensor size 1/3 inches, 6.0mm x 4,96mm Lens F1.4/26mm, C-mount Field of view 10° Focusing range 0.15m to inf Sensor CMOS 1/3” 1280 (h) x 960 (w) Size of pixel 3,75×3,75 µm Dynamic range 60 Db Relation signal to noise 54 Db Format 1 1280×960 (4, 8, 12.5, 16, 25, 30 Hz) Format 2 1280×720 (5, 10, 15, 20, 30, 40 Hz) Format 3 800×600 (6.25, 12.5, 20, 30, 40, 50 Hz) Format 4 640×480 (8, 16, 25, 32, 50, 64 Hz) Range of exposure 3,4×10-5 – 3,4×10-2 s Weight 0,2 kg Dimensions 55x55x75 mm DOWNLOAD MANUAL
